Grail B1203A Wafer Transfer System

The Grail B1203A wafer transfer system achieves wafer box (Foup) input and output through interaction with the customer's overhead hoist (OHT) system. It realizes inter-process stage transfer, conveyance, and storage of Foups through a FOUP robotic arm. Internal loadports enable Foup opening and mapping. The wafer transfer, merging, and splitting are accomplished through the wafer transfer system (WTS). Wafer status confirmation and data comparison are achieved through mapping at three locations. 50P wafer caching is realized through a fixed buffer (BF). Interfacing with the cleaning process robot is handled through a pan-tilt-zoom (PTZ) system. The top electrostatic field unit (EFU) maintains a cleanroom environment within the machine, and the top ion bars remove electrostatic residue from the transfer path.

Advantages

Strong compatibility

Applicable to wafer transfer systems of 150mm, 200mm, and 300mm.

Multiple transmission methods

Reliable transfer and storage of wafers from CST, Pod, and Foup to the process area is implemented, with both Cassette and Cassette-less types available.

Multiple modes

The equipment is used in the cleaning process, upstream and downstream of the cleaning machine, providing dirty wafers to the cleaning machine and recovering clean wafers after cleaning, and storing dirty, clean, and empty FOUPs.

Crane system interaction

Features interaction with client OHT system for FOUP handling, including FOUP transfer and storage, as well as wafer sorting, combining, and scanning functionalities.

Innovation

Multiple loading and unloading modes

It can be connected to a variety of loading and unloading methods, including manual, MGV, AGV, SMIF, and OHT.

High cleanliness level

The transmission area can meet the cleanliness level of Class 1.

Multiple functional options

Functional options can be provided for different process machines, such as Stocker, Buffer, Mapping, Aligner, etc.

High production capacity

Capacity can reach 650WPH.

International Certification

Has obtained professional certifications such as SEMI S2, F47, CE, and UL.

Application areas

Semiconductor Integrated Circuit

Semiconductor—Advanced Packaging

Power semiconductor

Compound semiconductor

Low Particulate Generation PA add≤5ea@28nm
High Reliability Failure Rate ≤50 ppm
High Capacity WPH≥700
Dual Process Paths Realization of independent path distinction before and after single-channel process
Scanning Real-time Mapping throughout the entire process, Lot information data comparison
Close-fitting Method Double 25 Batch
Defect Identification Wafer interaction anomaly detection

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